Fast reliability qualification of SiP products

C Regard, C Gautier, H Frémont, P Poirier, X Ma, KMB Jansen

Research output: Contribution to journalArticleScientificpeer-review

6 Citations (Scopus)


For the purpose of rapidly identifying the functional weak points of SiP products and defining appropriate design rules, a new methodology is proposed to achieve fast reliability qualification.
Original languageUndefined/Unknown
Pages (from-to)958-962
Number of pages5
JournalMicroelectronics Reliability
Issue number2009
Publication statusPublished - 2009


  • academic journal papers
  • CWTS JFIS < 0.75

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