@inproceedings{dbdf08381a0d49139425e0554e64cfd6,
title = "Fault (in)dependent cost estimates and conflict-directed backtracking to guide sequential circuit test generation",
keywords = "ZX Int.klas.verslagjaar < 2002",
author = "MH Konijnenburg and {van Linden}, JT and {van de Goor Ph D}, AJ",
year = "1999",
language = "Undefined/Unknown",
isbn = "0-7695-0315-2",
publisher = "IEEE",
pages = "185--191",
booktitle = "Eighth Asian Test Symposium: proceedings",
address = "United States",
note = "ATS '99, Shanghai ; Conference date: 16-11-1999 Through 18-11-1999",
}