Fault Localization of Embedded Software

RF Abreu, P Zoeteweij, AJC van Gemund

Research output: Chapter in Book/Conference proceedings/Edited volumeChapterProfessional

Original languageUndefined/Unknown
Title of host publicationTRADER: Reliability of High-Volume Consumer Products
EditorsR Mathijssen
Place of PublicationEindhoven
PublisherEmbedded Systems Institute
Number of pages178
ISBN (Print)978-90-78679-04-2
Publication statusPublished - 2009


  • Vakpubl., Overig wet. > 3 pag

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