Fault tolerance architecture for reliable hybrid CMOS/nanodevices memory

NZB Haron, S Hamdioui

Research output: Contribution to conference › Poster › Professional

Original languageUndefined/Unknown
Publication statusPublished - 2009
EventETS'09 - Sevilla, Spanje
Duration: 25 May 2009 → 29 May 2009

Other

OtherETS'09
Period25/05/09 → 29/05/09

Bibliographical note

s.n.

Keywords

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