Field dependence of resistance transitions in thin films of YBA2CU3O7 and YBA2CU4O8

P. Berghuis*, S. Q. Guo, A. L.F. Van der Slot, B. Dam, G. M. Stollman, P. H. Kes

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

3 Citations (Scopus)

Abstract

Preferentially oriented thin films of YBa2Cu3O7 (123) and YBa2Cu4O8 (248) with the c-axis perpendicular to the substrate have been prepared by e-gun evaporation from Y, BaF2 and Cu. Critical current and resistance transition measurements have been carried out in magnetic fields parallel to the c-axis. The results will be analysed in terms of a model for thermally activated flux flow combined with two models for flux pinning, one in which the pinning is predominantly caused by twin boundaries and a second in which pinning by dislocations is considered. The resistance broadening in the 248 is well described by the model with dislocation pinning. The Bc2 (T) values obtained from the fits compare well with estimates from the fluxflow resistivity and a kink in the resistance vs field curves. The slope of Bc2 at Tc is 0.37 T/K, a factor four smaller than in the 123.

Original languageEnglish
Pages (from-to)1169-1170
Number of pages2
JournalPhysica C: Superconductivity and its Applications
Volume162-164
Issue numberPART 2
DOIs
Publication statusPublished - Dec 1989

Fingerprint

Dive into the research topics of 'Field dependence of resistance transitions in thin films of YBA2CU3O7 and YBA2CU4O8'. Together they form a unique fingerprint.

Cite this