Finite sample confidence regions for parameters in prediction error identification using output error models

AJ den Dekker, XJA Bombois, PMJ Van den Hof

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

Original language	Undefined/Unknown
Title of host publication	Proceedings of the 17th IFAC world congress
Editors	Dongil Dan Cho (KR)
Place of Publication	Seoul, Korea
Publisher	IFAC
Pages	5024-5029
Number of pages	6
ISBN (Print)	978-1-1234-7890-2
Publication status	Published - 2008
Event	17th IFAC world congress - Seoul, Korea Duration: 6 Jul 2008 → 11 Jul 2008

Name
Publisher	IFAC

Conference	17th IFAC world congress
Period	6/07/08 → 11/07/08

Keywords

@inproceedings{7b080052338b44cb94b4b06299fe78ad,

title = "Finite sample confidence regions for parameters in prediction error identification using output error models",

keywords = "Conf.proc. > 3 pag",

author = "\{den Dekker\}, AJ and XJA Bombois and \{Van den Hof\}, PMJ",

year = "2008",

language = "Undefined/Unknown",

isbn = "978-1-1234-7890-2",

publisher = "IFAC",

pages = "5024--5029",

editor = "\{Dongil Dan Cho (KR)\}",

booktitle = "Proceedings of the 17th IFAC world congress",

note = "17th IFAC world congress ; Conference date: 06-07-2008 Through 11-07-2008",

}

Finite sample confidence regions for parameters in prediction error identification using output error models. / den Dekker, AJ; Bombois, XJA; Van den Hof, PMJ.
Proceedings of the 17th IFAC world congress. ed. / Dongil Dan Cho (KR). Seoul, Korea: IFAC, 2008. p. 5024-5029.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

TY - GEN

T1 - Finite sample confidence regions for parameters in prediction error identification using output error models

AU - den Dekker, AJ

AU - Bombois, XJA

AU - Van den Hof, PMJ

PY - 2008

Y1 - 2008

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 978-1-1234-7890-2

SP - 5024

EP - 5029

BT - Proceedings of the 17th IFAC world congress

A2 - Dongil Dan Cho (KR), null

PB - IFAC

CY - Seoul, Korea

T2 - 17th IFAC world congress

Y2 - 6 July 2008 through 11 July 2008

ER -