Fitting freeform shape patterns to scanned 3D objects (CIE-14656)

JSM Vergeest, S. Spanjaard, I Horvath, J.J.O. Jelier

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

    Original languageUndefined/Unknown
    Title of host publicationASME 2000 design engineering technical conferences and computers and information in engineering conference
    Place of PublicationAtlanta, Georgia (USA)
    PublisherASME
    Pages1-10
    Number of pages10
    Publication statusPublished - 2000
    EventDETC '00, Baltimore - Atlanta, Georgia (USA)
    Duration: 10 Sep 200013 Sep 2000

    Publication series

    Name
    PublisherASME

    Conference

    ConferenceDETC '00, Baltimore
    Period10/09/0013/09/00

    Bibliographical note

    CD-ROM

    Keywords

    • ZX Int.klas.verslagjaar < 2002

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