Flux-pinning enhancement by Ti induced defects in Bi2Sr2CaCu2O8+delta.

Chresten Træholt; HW Zandbergen; TW Li; RJ Drost; PH Kes; AA Menovsky

Flux-pinning enhancement by Ti induced defects in Bi2Sr2CaCu2O8+delta.

Chresten Træholt, HW Zandbergen, TW Li, RJ Drost, PH Kes, AA Menovsky

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	Undefined/Unknown
Title of host publication	Electron Microscopy 1996. Proceedings of EUREM-11, the 11th Conference on Electron Microscopy.
Place of Publication	Dublin, Ireland, 26-08-1998
Pages	86-87
Number of pages	2
Publication status	Published - 1998
Event	11th Conference on Electron Microscopy - Dublin, Ireland, 26-08-1996., Dublin, Ireland Duration: 26 Aug 1996 → 30 Aug 1996

Publication series

Name

Name	Materials Science
Volume	2
ISSN (Print)	1068-820X

Conference

Conference	11th Conference on Electron Microscopy
Country/Territory	Ireland
City	Dublin
Period	26/08/96 → 30/08/96

Cite this

@inproceedings{3900aeb7fc804e33a62b0c84b8f24613,

title = "Flux-pinning enhancement by Ti induced defects in Bi2Sr2CaCu2O8+delta.",

author = "Chresten Tr{\ae}holt and HW Zandbergen and TW Li and RJ Drost and PH Kes and AA Menovsky",

year = "1998",

language = "Undefined/Unknown",

isbn = "2960016300",

pages = "86--87",

booktitle = "Electron Microscopy 1996. Proceedings of EUREM-11, the 11th Conference on Electron Microscopy.",

note = "11th Conference on Electron Microscopy ; Conference date: 26-08-1996 Through 30-08-1996",

}

Træholt, C, Zandbergen, HW, Li, TW, Drost, RJ, Kes, PH & Menovsky, AA 1998, Flux-pinning enhancement by Ti induced defects in Bi2Sr2CaCu2O8+delta. in Electron Microscopy 1996. Proceedings of EUREM-11, the 11th Conference on Electron Microscopy.. Materials Science, vol. 2, Dublin, Ireland, 26-08-1998, pp. 86-87, 11th Conference on Electron Microscopy, Dublin, Ireland, 26/08/96.

Flux-pinning enhancement by Ti induced defects in Bi2Sr2CaCu2O8+delta. / Træholt, Chresten; Zandbergen, HW; Li, TW et al.
Electron Microscopy 1996. Proceedings of EUREM-11, the 11th Conference on Electron Microscopy.. Dublin, Ireland, 26-08-1998, 1998. p. 86-87 (Materials Science; Vol. 2).

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Flux-pinning enhancement by Ti induced defects in Bi2Sr2CaCu2O8+delta.

AU - Træholt, Chresten

AU - Zandbergen, HW

AU - Li, TW

AU - Drost, RJ

AU - Kes, PH

AU - Menovsky, AA

PY - 1998

Y1 - 1998

M3 - Conference contribution

SN - 2960016300

SP - 86

EP - 87

BT - Electron Microscopy 1996. Proceedings of EUREM-11, the 11th Conference on Electron Microscopy.

CY - Dublin, Ireland, 26-08-1998

T2 - 11th Conference on Electron Microscopy

Y2 - 26 August 1996 through 30 August 1996

ER -