Focused ion beam in an electron microscope

    Research output: Contribution to conferencePosterProfessional

    Original languageUndefined/Unknown
    Publication statusPublished - 2003
    EventBijeenkomst Kristal- en structuuronderzoek - Lunteren
    Duration: 31 Mar 20031 Apr 2003

    Other

    OtherBijeenkomst Kristal- en structuuronderzoek
    Period31/03/031/04/03

    Cite this

    Sivel, VGM., Alkemade, PFA., & Zandbergen, HW. (2003). Focused ion beam in an electron microscope. Poster session presented at Bijeenkomst Kristal- en structuuronderzoek, .