| Original language | Undefined/Unknown |
|---|---|
| Publication status | Published - 2003 |
| Event | Bijeenkomst Kristal- en structuuronderzoek - Lunteren Duration: 31 Mar 2003 → 1 Apr 2003 |
Other
| Other | Bijeenkomst Kristal- en structuuronderzoek |
|---|---|
| Period | 31/03/03 → 1/04/03 |
Focused ion beam in an electron microscope
VGM Sivel, PFA Alkemade, HW Zandbergen
Research output: Contribution to conference › Poster › Professional