Fracture and Delamination in Microelectronic Devices.

LJ Ernst, WD van Driel, O van der Sluis, A Corigliano, AAO Tay

Research output: Chapter in Book/Conference proceedings/Edited volumeChapterScientific

Original languageEnglish
Title of host publicationSmart systems integration and reliability.
EditorsMichel Bernd, Lang Klaus-Dieter
Place of PublicationDresden
PublisherGoldenbogen Verlag
Number of pages824
ISBN (Print)978-3-932434-77-8
Publication statusPublished - 2010

Bibliographical note



  • edited works: contributions
  • Boekdeel internat.wet

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