Full wavefield imaging of the near surface by JMI

Shogo Masaya; Eric Verschuur

Full wavefield imaging of the near surface by JMI

Research output: Chapter in Book/Conference proceedings/Edited volume › Chapter › Scientific

Original language	English
Title of host publication	Delphi; The Acquisition and Preprocessing Project (2015)
Subtitle of host publication	From seismic measurements to rock and pore parameters
Editors	Berkhout A.J., Verschuur D.J.
Place of Publication	Delft
Publisher	Delft University of Technology
Pages	113-131
Number of pages	19
Volume	XX
ISBN (Print)	978-90-73817-63-0
Publication status	Published - Jan 2016

Cite this

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title = "Full wavefield imaging of the near surface by JMI",

author = "Shogo Masaya and Eric Verschuur",

year = "2016",

month = jan,

language = "English",

isbn = "978-90-73817-63-0",

volume = "XX",

pages = "113--131",

editor = "Berkhout A.J. and Verschuur D.J.",

booktitle = "Delphi; The Acquisition and Preprocessing Project (2015)",

publisher = "Delft University of Technology",

address = "Netherlands",

}

Full wavefield imaging of the near surface by JMI. / Masaya, Shogo; Verschuur, Eric.
Delphi; The Acquisition and Preprocessing Project (2015): From seismic measurements to rock and pore parameters. ed. / Berkhout A.J.; Verschuur D.J. Vol. XX Delft: Delft University of Technology, 2016. p. 113-131.

Research output: Chapter in Book/Conference proceedings/Edited volume › Chapter › Scientific