Full Wavefield Migration for sparsely sampled 3D data

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

    3 Citations (Scopus)
    Original languageEnglish
    Title of host publicationProceedings of the SEG International Exposition and 85th annual meeting, expanded abstracts
    EditorsRV Schneider
    Place of PublicationTulsa, USA
    PublisherSEG
    Pages4206-4210
    Number of pages5
    ISBN (Print)1949-4645
    DOIs
    Publication statusPublished - 2015
    EventSEG International Exposition and 85th Annual Meeting, New Orleans, USA - Tulsa, USA
    Duration: 18 Oct 201523 Oct 2015

    Publication series

    Name
    PublisherSEG
    NameSEG Technical Program Expanded Abstracts
    Volume2015
    ISSN (Print)1052-3812

    Conference

    ConferenceSEG International Exposition and 85th Annual Meeting, New Orleans, USA
    Period18/10/1523/10/15

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