Full Wavefield Migration for sparsely sampled 3D data

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

3 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings of the SEG International Exposition and 85th annual meeting, expanded abstracts
EditorsRV Schneider
Place of PublicationTulsa, USA
PublisherSEG
Pages4206-4210
Number of pages5
ISBN (Print)1949-4645
DOIs
Publication statusPublished - 2015
EventSEG International Exposition and 85th Annual Meeting, New Orleans, USA - Tulsa, USA
Duration: 18 Oct 201523 Oct 2015

Publication series

Name
PublisherSEG
NameSEG Technical Program Expanded Abstracts
Volume2015
ISSN (Print)1052-3812

Conference

ConferenceSEG International Exposition and 85th Annual Meeting, New Orleans, USA
Period18/10/1523/10/15

Cite this

Davydenko, M., & Verschuur, DJ. (2015). Full Wavefield Migration for sparsely sampled 3D data. In RV. Schneider (Ed.), Proceedings of the SEG International Exposition and 85th annual meeting, expanded abstracts (pp. 4206-4210). (SEG Technical Program Expanded Abstracts; Vol. 2015). SEG. https://doi.org/10.1190/segam2015-5923846.1