Full Wavefield Migration: using surface and internal multiples in imaging1

    Research output: Chapter in Book/Conference proceedings/Edited volumeChapterScientific

    Original languageEnglish
    Title of host publicationDelphi. The Multiple Estimation and Structural Imaging Project (2016)
    Subtitle of host publicationFrom Seismic measurements to rock and pore parameters
    EditorsD.J. Verschuur
    Place of PublicationDelft
    PublisherDelft University of Technology
    Pages6.1-6.24
    Number of pages24
    VolumeXXVII
    ISBN (Print)978-90-73817-68-5
    Publication statusPublished - Jan 2017

    Keywords

    • Delphi

    Cite this

    Davydenko, M., & Verschuur, D. J. (2017). Full Wavefield Migration: using surface and internal multiples in imaging1. In D. J. Verschuur (Ed.), Delphi. The Multiple Estimation and Structural Imaging Project (2016): From Seismic measurements to rock and pore parameters (Vol. XXVII, pp. 6.1-6.24). Delft University of Technology.