Functional memory faults: a formal notation and a taxonomy

AJ van de Goor Ph D, Z Al-Ars

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

164 Citations (Scopus)
Original languageUndefined/Unknown
Title of host publicationProceedings 18th IEEE VLSI test symposium
Editors P Srimani
Place of PublicationLos Alamitos
PublisherIEEE
Pages281-289
Number of pages9
ISBN (Print)0-7695-0613-5
Publication statusPublished - 2000
EventIEEE VLSI test symposium, Montreal - Los Alamitos
Duration: 30 Apr 20004 May 2000

Publication series

Name
PublisherIEEE Computer Society

Conference

ConferenceIEEE VLSI test symposium, Montreal
Period30/04/004/05/00

Keywords

  • ZX Int.klas.verslagjaar < 2002

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