@inproceedings{210b3ff7e7ab4bc2b439d80acca7de1f,
title = "Functional memory faults: a formal notation and a taxonomy",
keywords = "ZX Int.klas.verslagjaar < 2002",
author = "{van de Goor Ph D}, AJ and Z Al-Ars",
year = "2000",
language = "Undefined/Unknown",
isbn = "0-7695-0613-5",
publisher = "IEEE",
pages = "281--289",
editor = "{P Srimani}",
booktitle = "Proceedings 18th IEEE VLSI test symposium",
address = "United States",
note = "IEEE VLSI test symposium, Montreal ; Conference date: 30-04-2000 Through 04-05-2000",
}