Gamma processes and peaks-over-threshold distributions for time-dependent reliability

JM van Noortwijk, JAM van der Weide, MJ Kallen, MD Pandey

Research output: Contribution to journal › Article › Scientific

Original language	Undefined/Unknown
Pages (from-to)	1651-1658
Number of pages	8
Journal	Reliability Engineering & System Safety
Volume	92
Publication status	Published - 2007

Keywords

@article{231a24e9907f4baf855603bce14d499d,

title = "Gamma processes and peaks-over-threshold distributions for time-dependent reliability",

keywords = "CWTS 0.75 <= JFIS < 2.00",

author = "{van Noortwijk}, JM and {van der Weide}, JAM and MJ Kallen and MD Pandey",

year = "2007",

language = "Undefined/Unknown",

volume = "92",

pages = "1651--1658",

journal = "Reliability Engineering & System Safety",

issn = "0951-8320",

publisher = "Elsevier",

}

TY - JOUR

T1 - Gamma processes and peaks-over-threshold distributions for time-dependent reliability

AU - van Noortwijk, JM

AU - van der Weide, JAM

AU - Kallen, MJ

AU - Pandey, MD

PY - 2007

Y1 - 2007

KW - CWTS 0.75 <= JFIS < 2.00

M3 - Article

SN - 0951-8320

VL - 92

SP - 1651

EP - 1658

JO - Reliability Engineering & System Safety

JF - Reliability Engineering & System Safety

ER -