Gamma processes and peaks-over-threshold distributions for time-dependent reliability

JM van Noortwijk, JAM van der Weide, MJ Kallen, MD Pandey

Research output: Contribution to journalArticleScientific

184 Citations (Scopus)
Original languageUndefined/Unknown
Pages (from-to)1651-1658
Number of pages8
JournalReliability Engineering & System Safety
Volume92
Publication statusPublished - 2007

Keywords

  • CWTS 0.75 <= JFIS < 2.00

Cite this

van Noortwijk, JM., van der Weide, JAM., Kallen, MJ., & Pandey, MD. (2007). Gamma processes and peaks-over-threshold distributions for time-dependent reliability. Reliability Engineering & System Safety, 92, 1651-1658.