Gamma processes and peaks-over-threshold distributions for time-dependent reliability

JM van Noortwijk, JAM van der Weide, MJ Kallen, MD Pandey

Research output: Contribution to journalArticleScientific

195 Citations (Scopus)
Original languageUndefined/Unknown
Pages (from-to)1651-1658
Number of pages8
JournalReliability Engineering & System Safety
Volume92
Publication statusPublished - 2007

Keywords

  • CWTS 0.75 <= JFIS < 2.00

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