Gamma-ray effects on CMOS image sensors in deep sub-micron technology

Rao padmakumar, X Wang, A Mierop, AJP Theuwissen

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

Original language	Undefined/Unknown
Title of host publication	Gamma-ray effects on CMOS image sensors in deep sub-micron technology
Editors	s.n.
Place of Publication	Maine, USA
Publisher	International Image sensor
Pages	70-73
Number of pages	4
Publication status	Published - 2007

Name
Publisher	International Image sensor

Keywords

@inproceedings{22361f4fa3544a0c9ce76d0268ba0e01,

title = "Gamma-ray effects on CMOS image sensors in deep sub-micron technology",

keywords = "Elektrotechniek, Techniek, professional journal papers, Conf.proc. > 3 pag",

author = "Rao padmakumar and X Wang and A Mierop and AJP Theuwissen",

year = "2007",

language = "Undefined/Unknown",

publisher = "International Image sensor",

pages = "70--73",

editor = "s.n.",

booktitle = "Gamma-ray effects on CMOS image sensors in deep sub-micron technology",

}

TY - GEN

T1 - Gamma-ray effects on CMOS image sensors in deep sub-micron technology

AU - padmakumar, Rao

AU - Wang, X

AU - Mierop, A

AU - Theuwissen, AJP

PY - 2007

Y1 - 2007

KW - Elektrotechniek

KW - Techniek

KW - professional journal papers

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SP - 70

EP - 73

BT - Gamma-ray effects on CMOS image sensors in deep sub-micron technology

A2 - s.n., null

PB - International Image sensor

CY - Maine, USA

ER -