Gamma-ray effects on CMOS image sensors in deep sub-micron technology

Rao padmakumar, X Wang, A Mierop, AJP Theuwissen

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

Original languageUndefined/Unknown
Title of host publicationGamma-ray effects on CMOS image sensors in deep sub-micron technology
Editors s.n.
Place of PublicationMaine, USA
PublisherInternational Image sensor
Pages70-73
Number of pages4
Publication statusPublished - 2007

Publication series

Name
PublisherInternational Image sensor

Keywords

  • Elektrotechniek
  • Techniek
  • professional journal papers
  • Conf.proc. > 3 pag

Cite this

padmakumar, R., Wang, X., Mierop, A., & Theuwissen, AJP. (2007). Gamma-ray effects on CMOS image sensors in deep sub-micron technology. In s.n. (Ed.), Gamma-ray effects on CMOS image sensors in deep sub-micron technology (pp. 70-73). International Image sensor.