GaN defect isolation for TEM by focussed ion beam (FIB) cutting.

FD Tichelaar, HW Zandbergen, F Morrissey, TR de Kruijff

    Research output: Book/ReportReportProfessional

    Original languageUndefined/Unknown
    Place of PublicationDelft
    PublisherDelft University of Technology
    Number of pages6
    Publication statusPublished - 2000

    Publication series

    Name
    PublisherTU Delft

    Keywords

    • ZX Int.klas.verslagjaar < 2002

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