Generation-Recombination Noise: The Fundamental Sensitivity Limit for Kinetic Inductance Detectors

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Original language	English
Pages (from-to)	335-340
Number of pages	6
Journal	Journal of Low Temperature Physics
Volume	167
Issue number	3-4
Publication status	Published - 2012

Cite this

@article{68b33c3168c24446af8835e0199b3fa5,

title = "Generation-Recombination Noise: The Fundamental Sensitivity Limit for Kinetic Inductance Detectors",

author = "{de Visser}, PJ and JJA Baselmans and P Diener and A Endo and TM Klapwijk",

year = "2012",

language = "English",

volume = "167",

pages = "335--340",

journal = "Journal of Low Temperature Physics",

issn = "0022-2291",

publisher = "Springer",

number = "3-4",

}