Generation-Recombination Noise: The Fundamental Sensitivity Limit for Kinetic Inductance Detectors

PJ de Visser, JJA Baselmans, P Diener, A Endo, TM Klapwijk

    Research output: Contribution to journalArticleScientificpeer-review

    19 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)335-340
    Number of pages6
    JournalJournal of Low Temperature Physics
    Volume167
    Issue number3-4
    Publication statusPublished - 2012

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