GrenchMark: Towards a Generic Framework for Analyzing, Testing, and Comparing Grids

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	Undefined/Unknown
Title of host publication	12th Annual Conference of the Advanced School for Computing and Imaging (ASCI'06)
Editors	J.W.J. Heijnsdijk, K.G. Langendoen
Place of Publication	Lommel, Belgium
Publisher	B.P.F. Lelieveldt et.al
Pages	21-29
Number of pages	9
Publication status	Published - 2006

Name
Publisher	B.P.F. Lelieveldt et.al

gmark06asci

Keywords

@inproceedings{43df18604bd24aeaabc75d1a82d4ab12,

title = "GrenchMark: Towards a Generic Framework for Analyzing, Testing, and Comparing Grids",

keywords = "Vakpubl., Overig wet. > 3 pag",

author = "A Iosup and DHJ Epema",

note = "gmark06asci",

year = "2006",

language = "Undefined/Unknown",

publisher = "B.P.F. Lelieveldt et.al",

pages = "21--29",

editor = "J.W.J. Heijnsdijk and K.G. Langendoen",

booktitle = "12th Annual Conference of the Advanced School for Computing and Imaging (ASCI'06)",

}

GrenchMark: Towards a Generic Framework for Analyzing, Testing, and Comparing Grids. / Iosup, A; Epema, DHJ.
12th Annual Conference of the Advanced School for Computing and Imaging (ASCI'06). ed. / J.W.J. Heijnsdijk; K.G. Langendoen. Lommel, Belgium: B.P.F. Lelieveldt et.al, 2006. p. 21-29.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - GrenchMark: Towards a Generic Framework for Analyzing, Testing, and Comparing Grids

AU - Iosup, A

AU - Epema, DHJ

N1 - gmark06asci

PY - 2006

Y1 - 2006

KW - Vakpubl., Overig wet. > 3 pag

M3 - Conference contribution

SP - 21

EP - 29

BT - 12th Annual Conference of the Advanced School for Computing and Imaging (ASCI'06)

A2 - Heijnsdijk, J.W.J.

A2 - Langendoen, K.G.

PB - B.P.F. Lelieveldt et.al

CY - Lommel, Belgium

ER -