| Original language | English |
|---|---|
| Pages (from-to) | 1-5 |
| Number of pages | 5 |
| Journal | Journal of Vacuum Science and Technology. Part B: Microelectronics and Nanometer Structures |
| Volume | 33 |
| Issue number | 6 |
| DOIs | |
| Publication status | Published - 2015 |
Helium ion beam induced growth of hammerhead AFM probes
G Nanda, E van Veldhoven, D Maas, H Sadeghian, PFA Alkemade
Research output: Contribution to journal › Article › Scientific › peer-review
13
Citations
(SciVal)