High accuracy absolute distance metrology.

BL Swinkels, N Bhattacharya, JJM Braat

Research output: Contribution to conferencePosterProfessional

Original languageUndefined/Unknown
Publication statusPublished - 2006
EventOne day symposium "prospect on high resolution imaging". - Delft
Duration: 3 Nov 20063 Nov 2006

Other

OtherOne day symposium "prospect on high resolution imaging".
Period3/11/063/11/06

Bibliographical note

TU Delft

Keywords

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