High accuracy absolute distance metrology.

BL Swinkels, N Bhattacharya, JJM Braat

Research output: Contribution to conferencePoster

Original languageUndefined/Unknown
Publication statusPublished - 2006
EventOne day symposium "prospect on high resolution imaging". - Delft
Duration: 3 Nov 20063 Nov 2006

Other

OtherOne day symposium "prospect on high resolution imaging".
Period3/11/063/11/06

Bibliographical note

TU Delft

Keywords

  • other public output
  • Geen BTA classificatie

Cite this