High aspect ratio transition edge sensors for x-ray spectrometry

M. De Wit*, L. Gottardi, E. Taralli, K. Nagayoshi, M. L. Ridder, M. P. Bruijn, J. Van Der Kuur, S. Visser, J. R. Gao

*Corresponding author for this work

Research output: Contribution to journal › Article › Scientific › peer-review

21 Citations (Scopus)

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Physics