High-Count Rate, Low Power and Low Noise Single Electron Readout ASIC in 65nm CMOS Technology

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Abstract

Particle detection circuits are used for a wide range of applications from experimental physics to material testing and medical imaging. State-of-the-art imaging systems, such as scanning electron microscopes (SEMs), demand the ability to detect small amounts of charge with small time-resolution and limited power consumption, creating an implementation dead-end for conventional readout topologies. In this paper, a particle detection readout based on an intersymbol interference cancellation scheme is introduced to address this issue. Evaluated in post-layout simulations, the proposed architecture can detect generated charges as small as 160 aC with 97.8% certainty. The readout can operate with event rates up to 400 MEvent/s while only consuming 2.85 mW of power.
Original languageEnglish
Title of host publication2021 XXX International Scientific Conference Electronics (ET)
Subtitle of host publicationProceedings
Place of PublicationPiscataway
PublisherIEEE
Number of pages5
ISBN (Electronic)978-1-6654-4518-4
ISBN (Print)978-1-6654-4519-1
DOIs
Publication statusPublished - 2021
Event2021 XXX International Scientific Conference Electronics (ET) - Sozopol, Bulgaria
Duration: 15 Sep 202117 Sep 2021

Conference

Conference2021 XXX International Scientific Conference Electronics (ET)
CountryBulgaria
CitySozopol
Period15/09/2117/09/21

Keywords

  • double-threshold technique
  • inter-symbol interference
  • low power
  • readout front-end
  • wideband

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