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Dive into the research topics of 'High-Count Rate, Low Power and Low Noise Single Electron Readout ASIC in 65nm CMOS Technology'. Together they form a unique fingerprint.- Sort by
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Matthew Al Disi, Alireza Mohammad Zaki, Qinwen Fan, Stoyan Nihtianov
Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review