High Current Density Electrical Breakdown of TiS3 Nanoribbon-Based Field-Effect Transistors

Aday J. Molina-Mendoza*, Joshua O. Island, Wendel S. Paz, Jose Manuel Clamagirand, Jose Ramón Ares, Eduardo Flores, Fabrice Leardini, Carlos Sánchez, Nicolás Agraït, Gabino Rubio-Bollinger, Herre S.J. van der Zant, Isabel J. Ferrer, JJ Palacios, Andres Castellanos-Gomez

*Corresponding author for this work

Research output: Contribution to journal › Article › Scientific › peer-review

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