High-efficiency silicon photodiode detector for sub-keV electron microscopy

A Sakic, G van Veen, K Kooijman, P. Vogelsang, TLM Scholtes, WB De Boer, J Derakhshandeh Kheljani, WHA Wien, S Milosavljevic, LK Nanver

Research output: Contribution to journalArticleScientificpeer-review

29 Citations (Scopus)
Original languageEnglish
Pages (from-to)2707-2714
Number of pages8
JournalIEEE Transactions on Electron Devices
Volume59
Issue number10
DOIs
Publication statusPublished - 2012

Bibliographical note

Harvest

Keywords

  • CWTS 0.75 <= JFIS < 2.00

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