High-performance cluster-fault tolerance scheme for hybrid nanoelectronic memories

NZB Haron, S Hamdioui

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

1 Citation (Scopus)
Original languageEnglish
Title of host publication2010 IEEEIntl. symp. on defect and fault tolerance in VLSI systems
Editors s.n.
Place of PublicationPiscataway
PublisherIEEE Society
Pages144-151
Number of pages8
ISBN (Print)978-0-7695-4243-0
Publication statusPublished - 2010
EventDFT 2010 - Piscataway
Duration: 6 Oct 20108 Oct 2010

Publication series

Name
PublisherIEEE

Conference

ConferenceDFT 2010
Period6/10/108/10/10

Keywords

  • conference contrib. refereed
  • Conf.proc. > 3 pag

Cite this

Haron, NZB., & Hamdioui, S. (2010). High-performance cluster-fault tolerance scheme for hybrid nanoelectronic memories. In s.n. (Ed.), 2010 IEEEIntl. symp. on defect and fault tolerance in VLSI systems (pp. 144-151). IEEE Society.