High performance single grain Si TFT X-ray image sensors

Research output: Contribution to conferenceAbstractScientific

20 Citations (Scopus)
Original languageEnglish
Pages1-2
Number of pages2
Publication statusPublished - 2010
Event13th SAFE Workshop STW.ICT Conference 2010, Veldhoven, the Netherlands - Utrecht, The Netherlands
Duration: 18 Nov 201019 Nov 2010

Conference

Conference13th SAFE Workshop STW.ICT Conference 2010, Veldhoven, the Netherlands
Period18/11/1019/11/10

Keywords

  • Geen BTA classificatie

Cite this