High performance single grain Si TFT X-ray image sensors

Research output: Contribution to conference › Abstract › Scientific

Original language	English
Pages	1-2
Number of pages	2
Publication status	Published - 2010
Event	13th SAFE Workshop STW.ICT Conference 2010, Veldhoven, the Netherlands - Utrecht, The Netherlands Duration: 18 Nov 2010 → 19 Nov 2010

Conference	13th SAFE Workshop STW.ICT Conference 2010, Veldhoven, the Netherlands
Period	18/11/10 → 19/11/10

Keywords

@conference{656a2b7490f4436981afb4cc04f340bf,

title = "High performance single grain Si TFT X-ray image sensors",

keywords = "Geen BTA classificatie",

author = "A Arslan and R Ishihara and CIM Beenakker",

year = "2010",

language = "English",

pages = "1--2",

note = "13th SAFE Workshop STW.ICT Conference 2010, Veldhoven, the Netherlands ; Conference date: 18-11-2010 Through 19-11-2010",

}

TY - CONF

T1 - High performance single grain Si TFT X-ray image sensors

AU - Arslan, A

AU - Ishihara, R

AU - Beenakker, CIM

PY - 2010

Y1 - 2010

KW - Geen BTA classificatie

UR - http://www.stwplatform.nl/downloads/programma-def.pdf

M3 - Abstract

SP - 1

EP - 2

T2 - 13th SAFE Workshop STW.ICT Conference 2010, Veldhoven, the Netherlands

Y2 - 18 November 2010 through 19 November 2010

ER -