High resolution EELS using monochromator and high performance spectrometer: comparison of V2O5 ELNES with NEXAFS and band structure calculations

DS Su; HW Zandbergen; PC Tiemeijer; G Kothleiner; M Havecker; C Hebert; A Knop-Gericke; BH Freitag; F Hofer; R Schlogl

High resolution EELS using monochromator and high performance spectrometer: comparison of V2O5 ELNES with NEXAFS and band structure calculations

DS Su, HW Zandbergen, PC Tiemeijer, G Kothleiner, M Havecker, C Hebert, A Knop-Gericke, BH Freitag, F Hofer, R Schlogl

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	Undefined/Unknown
Pages (from-to)	235-238
Number of pages	4
Journal	Micron
Volume	34
Issue number	3-5
Publication status	Published - 2003

Keywords

ZX CWTS JFIS < 1.00

Cite this

@article{2de15c5fa7a540139c549663116ff846,

title = "High resolution EELS using monochromator and high performance spectrometer: comparison of V2O5 ELNES with NEXAFS and band structure calculations",

keywords = "ZX CWTS JFIS < 1.00",

author = "DS Su and HW Zandbergen and PC Tiemeijer and G Kothleiner and M Havecker and C Hebert and A Knop-Gericke and BH Freitag and F Hofer and R Schlogl",

year = "2003",

language = "Undefined/Unknown",

volume = "34",

pages = "235--238",

journal = "Micron",

issn = "0968-4328",

publisher = "Elsevier",

number = "3-5",

}

TY - JOUR

T1 - High resolution EELS using monochromator and high performance spectrometer: comparison of V2O5 ELNES with NEXAFS and band structure calculations

AU - Su, DS

AU - Zandbergen, HW

AU - Tiemeijer, PC

AU - Kothleiner, G

AU - Havecker, M

AU - Hebert, C

AU - Knop-Gericke, A

AU - Freitag, BH

AU - Hofer, F

AU - Schlogl, R

PY - 2003

Y1 - 2003

KW - ZX CWTS JFIS < 1.00

M3 - Article

SN - 0968-4328

VL - 34

SP - 235

EP - 238

JO - Micron

JF - Micron

IS - 3-5

ER -