High-Resolution Electron Microscopy: From Imaging Toward Measuring

S van Aert, AJ den Dekker, A van den Bos, D Van Dyck

    Research output: Contribution to journalArticleScientificpeer-review

    18 Citations (Scopus)
    Original languageUndefined/Unknown
    Pages (from-to)611-615
    Number of pages5
    JournalIEEE Transactions on Instrumentation and Measurement
    Volume51
    Issue number4
    Publication statusPublished - 2002

    Keywords

    • ZX CWTS JFIS < 1.00

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