High Resolution Electron Microscopy: From Imaging Towards Measuring.

S van Aert; AJ den Dekker; A van den Bos; D Van Dyck

High Resolution Electron Microscopy: From Imaging Towards Measuring.

S van Aert, AJ den Dekker, A van den Bos, D Van Dyck

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

Original language	Undefined/Unknown
Title of host publication	Proceedings of IMTC\2001, the Instrumentation and Measurement Technology Conference.
Editors	Milton G Slade
Place of Publication	Piscataway, NJ.
Publisher	IEEE
Pages	2081-2086
Number of pages	6
ISBN (Print)	0-7803-6646-8
Publication status	Published - 2001
Event	IMTC\2001, the Instrumentation and Measurement Technology Conference, Budapest. - Piscataway, NJ. Duration: 21 May 2001 → 23 May 2001

Publication series

Name
Publisher	IEEE

Name
Volume	3

Conference

Conference	IMTC\2001, the Instrumentation and Measurement Technology Conference, Budapest.
Period	21/05/01 → 23/05/01

Keywords

ZX Int.klas.verslagjaar < 2002

Cite this

@inproceedings{55e4e6d2d2974a4b83203bc46aa9d120,

title = "High Resolution Electron Microscopy: From Imaging Towards Measuring.",

keywords = "ZX Int.klas.verslagjaar < 2002",

author = "{van Aert}, S and {den Dekker}, AJ and {van den Bos}, A and {Van Dyck}, D",

year = "2001",

language = "Undefined/Unknown",

isbn = "0-7803-6646-8",

publisher = "IEEE",

pages = "2081--2086",

editor = "Slade, {Milton G}",

booktitle = "Proceedings of IMTC\2001, the Instrumentation and Measurement Technology Conference.",

address = "United States",

note = "IMTC\2001, the Instrumentation and Measurement Technology Conference, Budapest. ; Conference date: 21-05-2001 Through 23-05-2001",

}

High Resolution Electron Microscopy: From Imaging Towards Measuring. / van Aert, S; den Dekker, AJ; van den Bos, A et al.
Proceedings of IMTC\2001, the Instrumentation and Measurement Technology Conference.. ed. / Milton G Slade. Piscataway, NJ.: IEEE, 2001. p. 2081-2086.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

TY - GEN

T1 - High Resolution Electron Microscopy: From Imaging Towards Measuring.

AU - van Aert, S

AU - den Dekker, AJ

AU - van den Bos, A

AU - Van Dyck, D

PY - 2001

Y1 - 2001

KW - ZX Int.klas.verslagjaar < 2002

M3 - Conference contribution

SN - 0-7803-6646-8

SP - 2081

EP - 2086

BT - Proceedings of IMTC\2001, the Instrumentation and Measurement Technology Conference.

A2 - Slade, Milton G

PB - IEEE

CY - Piscataway, NJ.

T2 - IMTC\2001, the Instrumentation and Measurement Technology Conference, Budapest.

Y2 - 21 May 2001 through 23 May 2001

ER -