High-resolution, integrated full wavefield migration of 3D surface seismic and VSP data

Research output: Chapter in Book/Conference proceedings/Edited volume › Chapter › Scientific

Original language	English
Title of host publication	Delphi; The Reservoir Characterization and Monitoring Project (2015)
Subtitle of host publication	From seismis measurements to rock and pore parameters
Editors	Berkhout A.J., Verschuur D.J.
Place of Publication	Delft
Publisher	Delft University of Technology
Pages	11-20
Number of pages	10
Volume	XIV
ISBN (Print)	978-90-73817-65-4
Publication status	Published - Jan 2016

Cite this

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title = "High-resolution, integrated full wavefield migration of 3D surface seismic and VSP data",

author = "{El Marhfoul}, Bouchaib and Eric Verschuur",

year = "2016",

month = jan,

language = "English",

isbn = "978-90-73817-65-4",

volume = "XIV",

pages = "11--20",

editor = "Berkhout A.J. and Verschuur D.J.",

booktitle = "Delphi; The Reservoir Characterization and Monitoring Project (2015)",

publisher = "Delft University of Technology",

address = "Netherlands",

}

High-resolution, integrated full wavefield migration of 3D surface seismic and VSP data. / El Marhfoul, Bouchaib ; Verschuur, Eric.
Delphi; The Reservoir Characterization and Monitoring Project (2015): From seismis measurements to rock and pore parameters. ed. / Berkhout A.J.; Verschuur D.J. Vol. XIV Delft: Delft University of Technology, 2016. p. 11-20.

Research output: Chapter in Book/Conference proceedings/Edited volume › Chapter › Scientific

TY - CHAP

T1 - High-resolution, integrated full wavefield migration of 3D surface seismic and VSP data

AU - El Marhfoul, Bouchaib

AU - Verschuur, Eric

PY - 2016/1

Y1 - 2016/1

M3 - Chapter

SN - 978-90-73817-65-4

VL - XIV

SP - 11

EP - 20

BT - Delphi; The Reservoir Characterization and Monitoring Project (2015)

A2 - A.J., Berkhout

A2 - D.J., Verschuur

PB - Delft University of Technology

CY - Delft

ER -