High-resolution non-invasive 3D imaging of paint microstructure by synchrotron-based X-ray laminography

P Reischig, L Helfen, A Wallert, T Baumbach, J Dik

    Research output: Contribution to journalArticleScientificpeer-review

    20 Citations (Scopus)
    Original languageUndefined/Unknown
    Pages (from-to)983-995
    Number of pages13
    JournalApplied Physics A: materials science & processing
    Volume111
    Issue number4
    DOIs
    Publication statusPublished - 2013

    Keywords

    • CWTS JFIS < 0.75

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