High resolution STEM probe size dependence on probe current and beam brightness

JE Barth, P Kruit

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

Original languageUndefined/Unknown
Title of host publicationProceedings of the 11th European Congress on Microscopy
EditorsM Steer
Place of PublicationDublin, Ireland
PublisherU.C.D. Belfield Dublin, Ireland
Pages-
Publication statusPublished - 1996
Event11th European Congress on Microscopy - Dublin, Ireland
Duration: 26 Aug 199630 Aug 1996

Publication series

Name
PublisherU.C.D. Belfield Dublin, Ireland

Conference

Conference11th European Congress on Microscopy
Period26/08/9630/08/96

Cite this

Barth, JE., & Kruit, P. (1996). High resolution STEM probe size dependence on probe current and beam brightness. In M. Steer (Ed.), Proceedings of the 11th European Congress on Microscopy (pp. -). U.C.D. Belfield Dublin, Ireland.