High resolution STEM probe size dependence on probe current and beam brightness

JE Barth, P Kruit

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

    Original languageUndefined/Unknown
    Title of host publicationProceedings of the 11th European Congress on Microscopy
    EditorsM Steer
    Place of PublicationDublin, Ireland
    PublisherU.C.D. Belfield Dublin, Ireland
    Publication statusPublished - 1996
    Event11th European Congress on Microscopy - Dublin, Ireland
    Duration: 26 Aug 199630 Aug 1996

    Publication series

    PublisherU.C.D. Belfield Dublin, Ireland


    Conference11th European Congress on Microscopy

    Bibliographical note

    Published on CDROM,\T\T11\BARTH\HIGH_RES.PDF.

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