High-temperature bulge-test setup for mechanical testing of free-standing thin films

AJ Kalkman, AH Verbruggen, GCAM Janssen

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	Undefined/Unknown
Pages (from-to)	1383-1385
Number of pages	3
Journal	Review of Scientific Instruments
Volume	74
Issue number	3
Publication status	Published - 2003

Klapwijk

Keywords

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title = "High-temperature bulge-test setup for mechanical testing of free-standing thin films",

keywords = "academic journal papers, ZX CWTS JFIS < 1.00",

author = "AJ Kalkman and AH Verbruggen and GCAM Janssen",

note = "Klapwijk",

year = "2003",

language = "Undefined/Unknown",

volume = "74",

pages = "1383--1385",

journal = "Review of Scientific Instruments",

issn = "0034-6748",

publisher = "American Institute of Physics Publising LLC",

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}

TY - JOUR

T1 - High-temperature bulge-test setup for mechanical testing of free-standing thin films

AU - Kalkman, AJ

AU - Verbruggen, AH

AU - Janssen, GCAM

N1 - Klapwijk

PY - 2003

Y1 - 2003

KW - academic journal papers

KW - ZX CWTS JFIS < 1.00

M3 - Article

SN - 0034-6748

VL - 74

SP - 1383

EP - 1385

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

IS - 3

ER -