High Time Resolution, Low-Noise, Power-Efficient, Charge-Sensitive Amplifier in 40 nm Technology

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Abstract

Particle detection circuits are used for a wide range of applications from experimental physics to material testing and medical imaging. In the state-of-The-Art systems, the trend is to design low-noise and low-power readout front-end electronics with a low detection error rate and small silicon area occupation. This paper presents the design of a high time resolution, low-noise, and power-efficient charge sensitive amplifier (CSA) in 40 nm CMOS technology. For every charge pulse of the detector, the CSA generates voltage signals with a peak amplitude of 30.6 mV, a rise time of 2.35 ns, and an equivalent noise charge (ENC) of 44e- with 0.14 mW power consumption.

Original languageEnglish
Title of host publication2022 31st International Scientific Conference Electronics, ET 2022 - Proceedings
PublisherIEEE
Number of pages6
ISBN (Electronic)9781665498784
DOIs
Publication statusPublished - 2022
Event31st International Scientific Conference Electronics, ET 2022 - Sozopol, Bulgaria
Duration: 13 Sept 202215 Sept 2022

Publication series

Name2022 31st International Scientific Conference Electronics, ET 2022 - Proceedings

Conference

Conference31st International Scientific Conference Electronics, ET 2022
Country/TerritoryBulgaria
CitySozopol
Period13/09/2215/09/22

Bibliographical note

Green Open Access added to TU Delft Institutional Repository ‘You share, we take care!’ – Taverne project https://www.openaccess.nl/en/you-share-we-take-care
Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.

Keywords

  • charge sensitive amplifier (CSA)
  • high time resolution
  • low-noise
  • power-efficient
  • readout front-end

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