Highly accelerated testing for LED modules, drivers, and systems

D. Schenkelaars, W. D. Van Driel

Research output: Chapter in Book/Conference proceedings/Edited volumeChapterScientificpeer-review

1 Citation (Scopus)

Abstract

Highly Accelerated Lifetime Testing (HALT) and Multi-Environment Overstress Testing (MEOST) procedures are used to test the reliability of LED modules, drivers, and systems. HALT and MEOST are very useful test methods to assess the reliability of LED modules, drivers, and systems. However experiences are only recent and hardly any significant feedback from the market is received. For assessment of the driver reliability a main advantage is the structural similarity with many Switch Mode Power Supplies used for other, traditional, lighting applications. For LED module- and system-level constructions, design and materials used often are new. Many different system solutions exist and many will still be developed at an increasing speed. This implies a higher reliability risk for LED modules and systems. In this chapter, we describe our current results of HALT and MEOST procedures for LED modules, drivers, and systems.

Original languageEnglish
Title of host publicationSolid State Lighting Reliability
Subtitle of host publicationComponents to Systems
PublisherSpringer
Pages231-242
Number of pages12
ISBN (Electronic)9781461430674
ISBN (Print)9781461430667
DOIs
Publication statusPublished - 1 Jan 2013
Externally publishedYes

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