Hot-carrier degradation analysis based on ring oscillators

JC Wang, E Olthof, JW Metselaar

Research output: Contribution to journalArticleScientificpeer-review

3 Citations (Scopus)
Original languageUndefined/Unknown
Pages (from-to)1858-1863
Number of pages6
JournalMicroelectronics Reliability
Volume46
Publication statusPublished - 2006

Keywords

  • academic journal papers
  • CWTS JFIS < 0.75

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