Sputter deposited Mg2FexSi1-x films of 250 nm thickness have been investigated by means of Mössbauer spectroscopy. While non-hydrogenated films are characterized by a quadrupole split doublet, hydrogenated regions show a singlet with reduced isomer shift. The relative areas of the spectra reflect the relation between loaded and unloaded regions prepared at the same loading conditions.
|Journal||Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms|
|Publication status||Published - 31 Aug 2018|
- Hydrogen storage
- Mössbauer spectroscopy