Abstract
Sputter deposited Mg2FexSi1-x films of 250 nm thickness have been investigated by means of Mössbauer spectroscopy. While non-hydrogenated films are characterized by a quadrupole split doublet, hydrogenated regions show a singlet with reduced isomer shift. The relative areas of the spectra reflect the relation between loaded and unloaded regions prepared at the same loading conditions.
Original language | English |
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Pages (from-to) | 109-112 |
Journal | Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms |
Volume | 434 |
DOIs | |
Publication status | Published - 31 Aug 2018 |
Keywords
- Hydrogen storage
- Mössbauer spectroscopy