Hydrogen storage in Mg2FeSi alloy thin films depending on the Fe-to-Si ratio measured by conversion electron Mössbauer spectroscopy

T. T. Trinh, K. Asano, R. Heller, H. Reuther, J. Grenzer, H. Schreuders, B. Dam, K. Potzger

Research output: Contribution to journalArticleScientificpeer-review

1 Citation (Scopus)

Abstract

Sputter deposited Mg2FexSi1-x films of 250 nm thickness have been investigated by means of Mössbauer spectroscopy. While non-hydrogenated films are characterized by a quadrupole split doublet, hydrogenated regions show a singlet with reduced isomer shift. The relative areas of the spectra reflect the relation between loaded and unloaded regions prepared at the same loading conditions.

Original languageEnglish
Pages (from-to)109-112
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume434
DOIs
Publication statusPublished - 31 Aug 2018

Keywords

  • Hydrogen storage
  • Mössbauer spectroscopy

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