I-V characteristics of a-Si:H p-i-n diodes with uniform and non-uniform defect distributions

MA Kroon; RACMM Swaaij; JW Metselaar

I-V characteristics of a-Si:H p-i-n diodes with uniform and non-uniform defect distributions

MA Kroon, RACMM Swaaij, JW Metselaar

Electronic Components, Technology and Materials

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	Undefined/Unknown
Title of host publication	Symposium proceedings. Vol 609
Editors	RW Collins, ... [et Al]
Place of Publication	Warrendale
Publisher	Material Research Society
Pages	1-6
Number of pages	6
ISBN (Print)	0272-9172
Publication status	Published - 2000
Event	Amorphous and Heterogeneous Silicon Thin Films - 2000, San Francisco - Warrendale Duration: 24 Apr 2000 → 28 Apr 2000

Publication series

Name
Publisher	Material Research Society

Conference

Conference	Amorphous and Heterogeneous Silicon Thin Films - 2000, San Francisco
Period	24/04/00 → 28/04/00

Keywords

ZX Int.klas.verslagjaar < 2002

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

Cite this

@inproceedings{52b5e097cad1483ab2aa1113836da681,

title = "I-V characteristics of a-Si:H p-i-n diodes with uniform and non-uniform defect distributions",

keywords = "ZX Int.klas.verslagjaar < 2002",

author = "MA Kroon and RACMM Swaaij and JW Metselaar",

year = "2000",

language = "Undefined/Unknown",

isbn = "0272-9172",

publisher = "Material Research Society",

pages = "1--6",

editor = "{RW Collins} and {... [et Al]}",

booktitle = "Symposium proceedings. Vol 609",

note = "Amorphous and Heterogeneous Silicon Thin Films - 2000, San Francisco ; Conference date: 24-04-2000 Through 28-04-2000",

}

I-V characteristics of a-Si:H p-i-n diodes with uniform and non-uniform defect distributions. / Kroon, MA; Swaaij, RACMM; Metselaar, JW.
Symposium proceedings. Vol 609. ed. / RW Collins; ... [et Al]. Warrendale: Material Research Society, 2000. p. 1-6.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - I-V characteristics of a-Si:H p-i-n diodes with uniform and non-uniform defect distributions

AU - Kroon, MA

AU - Swaaij, RACMM

AU - Metselaar, JW

PY - 2000

Y1 - 2000

KW - ZX Int.klas.verslagjaar < 2002

M3 - Conference contribution

SN - 0272-9172

SP - 1

EP - 6

BT - Symposium proceedings. Vol 609

A2 - RW Collins, null

A2 - ... [et Al], null

PB - Material Research Society

CY - Warrendale

T2 - Amorphous and Heterogeneous Silicon Thin Films - 2000, San Francisco

Y2 - 24 April 2000 through 28 April 2000

ER -