Identification of time series models from segments - application to scanning transmission electron microscopy images

JS Erkelens, A Tejada Ruiz, AJ den Dekker

Research output: Contribution to journalArticleScientificpeer-review

3 Citations (Scopus)
Original languageEnglish
Pages (from-to)3231-3242
Number of pages12
JournalIEEE Transactions on Instrumentation and Measurement
Volume62
Issue number12
DOIs
Publication statusPublished - 2013

Keywords

  • CWTS JFIS < 0.75

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