Image reconstruction of an electrical capacitance tomography system using an artificial neural network.

TD Sun, RF Mudde, JC Schouten, B Scarlett, CM van den Bleek

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

    17 Citations (Scopus)
    Original languageUndefined/Unknown
    Title of host publicationProceedings of the 1st World Congress on Industrial Process Tomography.
    EditorsT York, T Dyakowski, T Peyton, A Hunt
    Pages174-180
    Number of pages7
    Publication statusPublished - 1999

    Cite this

    Sun, TD., Mudde, RF., Schouten, JC., Scarlett, B., & van den Bleek, CM. (1999). Image reconstruction of an electrical capacitance tomography system using an artificial neural network. In T. York, T. Dyakowski, T. Peyton, & A. Hunt (Eds.), Proceedings of the 1st World Congress on Industrial Process Tomography. (pp. 174-180)