Image reconstruction of an electrical capacitance tomography system using an artificial neural network.

TD Sun, RF Mudde, JC Schouten, B Scarlett, CM van den Bleek

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

    17 Citations (Scopus)
    Original languageUndefined/Unknown
    Title of host publicationProceedings of the 1st World Congress on Industrial Process Tomography.
    EditorsT York, T Dyakowski, T Peyton, A Hunt
    Pages174-180
    Number of pages7
    Publication statusPublished - 1999

    Cite this