Image reconstruction of an electrical capacitance tomography system using an artificial neural network.

TD Sun, RF Mudde, JC Schouten, B Scarlett, CM van den Bleek

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

Original language	Undefined/Unknown
Title of host publication	Proceedings of the 1st World Congress on Industrial Process Tomography.
Editors	T York, T Dyakowski, T Peyton, A Hunt
Pages	174-180
Number of pages	7
Publication status	Published - 1999

Cite this

@inproceedings{78bac6296d914b43a1aae5f5daa402d5,

title = "Image reconstruction of an electrical capacitance tomography system using an artificial neural network.",

author = "TD Sun and RF Mudde and JC Schouten and B Scarlett and \{van den Bleek\}, CM",

year = "1999",

language = "Undefined/Unknown",

pages = "174--180",

editor = "T York and T Dyakowski and T Peyton and A Hunt",

booktitle = "Proceedings of the 1st World Congress on Industrial Process Tomography.",

}

Image reconstruction of an electrical capacitance tomography system using an artificial neural network. / Sun, TD; Mudde, RF; Schouten, JC et al.
Proceedings of the 1st World Congress on Industrial Process Tomography.. ed. / T York; T Dyakowski; T Peyton; A Hunt. 1999. p. 174-180.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

TY - GEN

T1 - Image reconstruction of an electrical capacitance tomography system using an artificial neural network.

AU - Sun, TD

AU - Mudde, RF

AU - Schouten, JC

AU - Scarlett, B

AU - van den Bleek, CM

PY - 1999

Y1 - 1999

UR - https://www.scopus.com/pages/publications/80052763187

M3 - Conference contribution

SP - 174

EP - 180

BT - Proceedings of the 1st World Congress on Industrial Process Tomography.

A2 - York, T

A2 - Dyakowski, T

A2 - Peyton, T

A2 - Hunt, A

ER -