Imaging vertical seismic profiling data using full wavefield migration, Th-17-11

AK Soni; DJ Verschuur

Imaging vertical seismic profiling data using full wavefield migration, Th-17-11

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	English
Title of host publication	Extended Abstracts of the 75th Annual EAGE Conference
Editors	M. van Kraanen
Place of Publication	Houten, The Netherlands
Publisher	EAGE
Pages	1-4
Number of pages	4
ISBN (Print)	978-90-73-434-48-5
Publication status	Published - 2013
Event	The 75th EAGE conference & exhibition incorporating SPE EUROPEC 2013, London, United Kingdom - Houten Duration: 10 Jun 2013 → 13 Jun 2013

Publication series

Name
Publisher	EAGE

Conference

Conference	The 75th EAGE conference & exhibition incorporating SPE EUROPEC 2013, London, United Kingdom
Period	10/06/13 → 13/06/13

Cite this

@inproceedings{b0cae678f10844c9b0002b7e07f1534e,

title = "Imaging vertical seismic profiling data using full wavefield migration, Th-17-11",

author = "AK Soni and DJ Verschuur",

year = "2013",

language = "English",

isbn = "978-90-73-434-48-5",

publisher = "EAGE",

pages = "1--4",

editor = "{van Kraanen}, M.",

booktitle = "Extended Abstracts of the 75th Annual EAGE Conference",

note = "The 75th EAGE conference & exhibition incorporating SPE EUROPEC 2013, London, United Kingdom ; Conference date: 10-06-2013 Through 13-06-2013",

}

TY - GEN

T1 - Imaging vertical seismic profiling data using full wavefield migration, Th-17-11

AU - Soni, AK

AU - Verschuur, DJ

PY - 2013

Y1 - 2013

M3 - Conference contribution

SN - 978-90-73-434-48-5

SP - 1

EP - 4

BT - Extended Abstracts of the 75th Annual EAGE Conference

A2 - van Kraanen, M.

PB - EAGE

CY - Houten, The Netherlands

T2 - The 75th EAGE conference & exhibition incorporating SPE EUROPEC 2013, London, United Kingdom

Y2 - 10 June 2013 through 13 June 2013

ER -