Impact of stresses on the fault coverage of memory tests

S Hamdioui, Z Al-Ars, AJ van de Goor, R Wadsworth

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

2 Citations (Scopus)
Original languageUndefined/Unknown
Title of host publicationProceedings of the IEEE international workshop on memory technology, design and testing
Editors s.n.
Place of PublicationLos Alamitos
PublisherIEEE Society
Pages103-108
Number of pages6
ISBN (Print)0-7695-2313-7
Publication statusPublished - 2005
Event2005 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT'05), Taipei, Taiwan - Los Alamitos
Duration: 3 Aug 20055 Aug 2005

Publication series

Name
PublisherIEEE

Conference

Conference2005 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT'05), Taipei, Taiwan
Period3/08/055/08/05

Keywords

  • conference contrib. refereed
  • Conf.proc. > 3 pag

Cite this