Impact of the emitter stored charge on RF noise of junction bipolar transistors

F Vitale, R van der Toorn

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Original languageEnglish
Title of host publication2012 IEEE Bipolar / BICMOS Circuits and Technology Meeting (BCTM 2012)
EditorsJD Cressler
Place of PublicationPiscataway
PublisherIEEE Society
Pages1-4
Number of pages4
ISBN (Print)978-1-4673-3021-3
DOIs
Publication statusPublished - 2012
Event2012 IEEE Bipolar / BICMOC Circuits and Technology Meeting (BCTM 2012), Portland, Oregon - Piscataway
Duration: 30 Sep 20123 Oct 2012

Publication series

Name
PublisherIEEE

Conference

Conference2012 IEEE Bipolar / BICMOC Circuits and Technology Meeting (BCTM 2012), Portland, Oregon
Period30/09/123/10/12

Cite this

Vitale, F., & van der Toorn, R. (2012). Impact of the emitter stored charge on RF noise of junction bipolar transistors. In JD. Cressler (Ed.), 2012 IEEE Bipolar / BICMOS Circuits and Technology Meeting (BCTM 2012) (pp. 1-4). IEEE Society. https://doi.org/10.1109/BCTM.2012.6352625