Impact of the emitter stored charge on RF noise of junction bipolar transistors

F Vitale; R van der Toorn

doi:10.1109/BCTM.2012.6352625

Impact of the emitter stored charge on RF noise of junction bipolar transistors

Electronic Components, Technology and Materials

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	English
Title of host publication	2012 IEEE Bipolar / BICMOS Circuits and Technology Meeting (BCTM 2012)
Editors	JD Cressler
Place of Publication	Piscataway
Publisher	IEEE Society
Pages	1-4
Number of pages	4
ISBN (Print)	978-1-4673-3021-3
DOIs	https://doi.org/10.1109/BCTM.2012.6352625
Publication status	Published - 2012
Event	2012 IEEE Bipolar / BICMOC Circuits and Technology Meeting (BCTM 2012), Portland, Oregon - Piscataway Duration: 30 Sept 2012 → 3 Oct 2012

Publication series

Name
Publisher	IEEE

Conference

Conference	2012 IEEE Bipolar / BICMOC Circuits and Technology Meeting (BCTM 2012), Portland, Oregon
Period	30/09/12 → 3/10/12

Bibliographical note

Harvest

Access to Document

10.1109/BCTM.2012.6352625

Cite this

@inproceedings{03f00bae09fb4d258fcd73a02130e49c,

title = "Impact of the emitter stored charge on RF noise of junction bipolar transistors",

author = "F Vitale and {van der Toorn}, R",

note = "Harvest; 2012 IEEE Bipolar / BICMOC Circuits and Technology Meeting (BCTM 2012), Portland, Oregon ; Conference date: 30-09-2012 Through 03-10-2012",

year = "2012",

doi = "10.1109/BCTM.2012.6352625",

language = "English",

isbn = "978-1-4673-3021-3",

publisher = "IEEE Society",

pages = "1--4",

editor = "JD Cressler",

booktitle = "2012 IEEE Bipolar / BICMOS Circuits and Technology Meeting (BCTM 2012)",

}

Vitale, F & van der Toorn, R 2012, Impact of the emitter stored charge on RF noise of junction bipolar transistors. in JD Cressler (ed.), 2012 IEEE Bipolar / BICMOS Circuits and Technology Meeting (BCTM 2012). IEEE Society, Piscataway, pp. 1-4, 2012 IEEE Bipolar / BICMOC Circuits and Technology Meeting (BCTM 2012), Portland, Oregon, 30/09/12. https://doi.org/10.1109/BCTM.2012.6352625

Impact of the emitter stored charge on RF noise of junction bipolar transistors. / Vitale, F; van der Toorn, R.
2012 IEEE Bipolar / BICMOS Circuits and Technology Meeting (BCTM 2012). ed. / JD Cressler. Piscataway: IEEE Society, 2012. p. 1-4.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Impact of the emitter stored charge on RF noise of junction bipolar transistors

AU - Vitale, F

AU - van der Toorn, R

N1 - Harvest

PY - 2012

Y1 - 2012

U2 - 10.1109/BCTM.2012.6352625

DO - 10.1109/BCTM.2012.6352625

M3 - Conference contribution

SN - 978-1-4673-3021-3

SP - 1

EP - 4

BT - 2012 IEEE Bipolar / BICMOS Circuits and Technology Meeting (BCTM 2012)

A2 - Cressler, JD

PB - IEEE Society

CY - Piscataway

T2 - 2012 IEEE Bipolar / BICMOC Circuits and Technology Meeting (BCTM 2012), Portland, Oregon

Y2 - 30 September 2012 through 3 October 2012

ER -