Abstract
In this contribution, we describe the modeling approaches and the characterization procedures used to develop accurate standard models for cryogenic, probe-level, calibrations substrates.The key electrical and mechanical parameters of the impedance terminations and the lines used in commercially available impedance standard substrates are first characterized versus temperature. After, these component are simulated using 2.5D EM solvers including their mechanical variation when exposed to cryogenic temperatures, to extract their nominal response at 7 Kelvin. The quality of the resulting calibrations at cryogenic is evaluated first using independent CPW lines on the calibration substrates and then by measuring the response of a transformer-based resonator realized on a Si-based technology.Ambient temperature models are used as a comparison, to highlight the accuracy improvement that can be achieved employing optimized Cryo-EM based models.
Original language | English |
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Title of host publication | 2023 IEEE/MTT-S International Microwave Symposium, IMS 2023 |
Publisher | IEEE |
Pages | 557-560 |
ISBN (Electronic) | 9798350347647 |
DOIs | |
Publication status | Published - 2023 |
Event | 2023 IEEE/MTT-S International Microwave Symposium, IMS 2023 - San Diego, United States Duration: 11 Jun 2023 → 16 Jun 2023 |
Publication series
Name | IEEE MTT-S International Microwave Symposium Digest |
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Volume | 2023-June |
ISSN (Print) | 0149-645X |
Conference
Conference | 2023 IEEE/MTT-S International Microwave Symposium, IMS 2023 |
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Country/Territory | United States |
City | San Diego |
Period | 11/06/23 → 16/06/23 |
Bibliographical note
Green Open Access added to TU Delft Institutional Repository ‘You share, we take care!’ – Taverne project https://www.openaccess.nl/en/you-share-we-take-careOtherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.