Impedance Standard Substrate Characterization and em model definition for Cryogenic and Quantum-Computing Applications

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Abstract

In this contribution, we describe the modeling approaches and the characterization procedures used to develop accurate standard models for cryogenic, probe-level, calibrations substrates.The key electrical and mechanical parameters of the impedance terminations and the lines used in commercially available impedance standard substrates are first characterized versus temperature. After, these component are simulated using 2.5D EM solvers including their mechanical variation when exposed to cryogenic temperatures, to extract their nominal response at 7 Kelvin. The quality of the resulting calibrations at cryogenic is evaluated first using independent CPW lines on the calibration substrates and then by measuring the response of a transformer-based resonator realized on a Si-based technology.Ambient temperature models are used as a comparison, to highlight the accuracy improvement that can be achieved employing optimized Cryo-EM based models.

Original languageEnglish
Title of host publication2023 IEEE/MTT-S International Microwave Symposium, IMS 2023
PublisherIEEE
Pages557-560
ISBN (Electronic)9798350347647
DOIs
Publication statusPublished - 2023
Event2023 IEEE/MTT-S International Microwave Symposium, IMS 2023 - San Diego, United States
Duration: 11 Jun 202316 Jun 2023

Publication series

NameIEEE MTT-S International Microwave Symposium Digest
Volume2023-June
ISSN (Print)0149-645X

Conference

Conference2023 IEEE/MTT-S International Microwave Symposium, IMS 2023
Country/TerritoryUnited States
CitySan Diego
Period11/06/2316/06/23

Bibliographical note

Green Open Access added to TU Delft Institutional Repository ‘You share, we take care!’ – Taverne project https://www.openaccess.nl/en/you-share-we-take-care
Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.

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