@inproceedings{8fc940b2c00547c58d9c46160f7ddc32,
title = "Implementation of General Coupling Model of Electromigration in ANSYS",
abstract = "In this paper, a recently developed theory - general coupling model of electromigration, is implemented in ANSYS. We first identify several errors provided in ANSYS manual for electromigration modeling. Then the general coupling model is implemented in ANSYS and the detailed description is presented. Finally, a 1-D confined metal line with a perfectly blocking condition is presented as a benchmark problem, in which the finite element solutions are in excellent agreement with the analytical solutions.",
keywords = "electromigration, finite element analysis, general coupling theory, multiphysics modeling",
author = "Zhen Cui and Xuejun Fan and Guoqi Zhang",
note = "Accepted author manuscript; 70th IEEE Electronic Components and Technology Conference, ECTC 2020 ; Conference date: 03-06-2020 Through 30-06-2020",
year = "2020",
doi = "10.1109/ECTC32862.2020.00256",
language = "English",
isbn = "978-1-7281-6181-5",
series = "2020 IEEE 70TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC 2020)",
publisher = "IEEE",
pages = "1632--1637",
editor = "L. O'Conner and H. Torres",
booktitle = "2020 IEEE 70th Electronic Components and Technology Conference (ECTC)",
address = "United States",
}