Importance of dynamic faults for new SRAM technologies

S Hamdioui, R Wadsworth, JD Reyes, AJ van de Goor

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

43 Citations (Scopus)
Original languageUndefined/Unknown
Title of host publicationETW 2003; Eighth IEEE European test workshop
Editors s.n.
Place of PublicationPiscataway
PublisherIEEE Society
Pages29-34
Number of pages6
ISBN (Print)0-7695-1908-3
Publication statusPublished - 2003
EventEighth IEEE European test workshop, Maastricht, The Netherlands - Piscataway
Duration: 25 May 200328 May 2003

Publication series

Name
PublisherIEEE

Conference

ConferenceEighth IEEE European test workshop, Maastricht, The Netherlands
Period25/05/0328/05/03

Keywords

  • Conf.proc. > 3 pag

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